217 Table I. Filling patterns Energy [GeV] 8 Number of buckets 2436 40.15 / 18.35 Current [mA]: single bunch 12 multi-bunch 100 Bunch length ( ) [psec] σ σ 13 Horizontal emittance [nm·rad] 3.4 * Vertical emittance [pm·rad] 6.8 * Coupling [%] 0.2 RF Voltage [MV] 16 Momentum acceptance [%] 3 (= 240 MeV) Beam size [ m]: ( x / y ) * [ m] μ μ μ μ σ σ σ σ Long ID section 294 / 10 ID section 301 / 6 BM section 107 / 13 Beam divergence [ rad]: ( x’ / y’ ) * [ rad] μ μ σ σ σ σ μ μ Long ID section 13 / 0.7 ID section 12 / 1.1 BM section 56 / 0.6 Operational chromaticities: ( x / y ) ξ ξ ξ ξ Lifetime [hr]: 100 mA (multi-bunch) ~ 200 1 mA (single bunch) ~ 20 Horizontal dispersion [m]: Long ID section 0.103 ID section 0.107 BM section 0.032 Fast orbit stability (0.1 – 200 Hz)[ m]: μ μ horizontal (rms) ~ 4 ~ 1 vertical (rms) * Assuming 0.2% coupling for “Low Emittance Optics” ** With bunch-by-bunch feedback +2 / +2 ** Tunes ( x / y ) ν ν ν ν bunch current life time Multi-bunch (160 bunch-train 12) × 0.05 mA ~ 200 hr 203 bunches 0.5 mA 25 ~ 30 hr 4 bunch-train 11 bunch-train × 84 0.3 mA 35 ~ 50 hr × 29 0.3 mA 35 ~ 50 hr 1/7 - filling + 5 single bunches 1/14 - filling + 12 single bunches 2/29 - filling + 26 single bunches 4/58 - filling + 53 single bunches 3.0 mA (single) 18 ~ 25 hr 1.6 mA (single) 18 ~ 25 hr 1.4 mA (single) 18 ~ 25 hr 1.0 mA (single) 18 ~ 25 hr Table II. Beam parameters of SPring-8 storage ring Beamlines Beamlines The electron storage ring of the SPring-8 accelerator complex can potentially accommodate sixty-two beamlines (34 insertion devices, 4 long undulators, 23 bending magnets and 1 infrared). Currently, 49 beamlines are operational, reaching 75% of its full capacity as shown in the beamline map (Fig. 3) and list of beamlines (Table III). The beamlines are categorized into the following four groups: (1) public beamlines, (2) contract beamlines, (3) RIKEN beamlines, and (4) accelerator beam diagnostic beamlines. The portfolio of SPring-8 beamlines is significantly increasing its variation. A new public beamline called “Engineering Science Research II (BL14B2)” became in operation since last autumn in order to appropriately respond to those users coming from industrial domain for XAFS experiments. In addition, there have been four contact beamlines approved, which are “LEPS2 (BL31IS),” “Univ-of-Tokyo (BL07LSU),” “TOYOTA (BL33XU),” and “Frontier Soft Matter (BL03XU). Furthermore, RIKEN has decided to construct a new beamline called “RIKEN Targeted Proteins (BL32XU).” At the time of writing this report, there are 26 public beamlines in operation: 11 BM beamlines, 14 ID beamlines (12 hard X-ray beamlines and 2 soft X-ray beamlines), and one infrared beamline. As for contract beamlines, 14 beamlines are operational and three beamlines are under construction. Among the eight RIKEN beamlines, seven of them are operational and the last one under construction. There are two accelerator diagnostic lines, both in operation. In order to effectively and efficiently promote the priority industrial application proposals started in April 2007, “R&D Beamline (BL46XU)” has become specialized in industrial applications, and its name was changed to “Engineering Science Research III” from 2007B. The contract beamlines are installed, owned, operated and maintained by universities, companies, and other organizations for exclusive use by 218 Fig. 3. Beamline map. contractors. Currently, there are 14 contract beamlines in operation and three new contract beamlines are scheduled for construction as mentioned above. The experimental stations of BL22XU and BL23SU are located at JAEA's RI Laboratory and are dedicated to research utilizing radioactive isotopes and actinide materials. The National Synchrotron Radiation Research Center of Taiwan (NSRRC) was the first foreign organization to construct contract beamlines at SPring-8, i.e., BL12B2 and BL12XU. There are 7 RIKEN beamlines for their exclusive use to promote RIKEN's research activities, although 20% of the beamtime is reserved for public use. RIKEN BL19LXU is the only beamline equipped with a long undulator, realizing the highest degree of brilliance. BL26B1 and BL26B2 are the beamlines used for high-throughput protein crystallography, a method used in the human genome project. BL29XU has two experimental stations, one located in the experimental hall and the other at the end of the 1 km beamline. BL # Beamline Name Public Beamlines H Areas of Research XAFS Single Crystal Structure Analysis Powder Diffraction High Temperature and High Pressure Research High Energy X-ray Diffraction High Energy Inelastic Scattering Nuclear Resonant Scattering High Pressure Research Surface and Interface Structures Engineering Science Research Engineering Science Research II I Medical and Imaging II Medical and Imaging I Soft X-ray Spectroscopy of Solid Soft X-ray Photochemistry White Beam X-ray Diffraction High Resolution Inelastic Scattering Trace Element Analysis Structural Biology III Magnetic Materials High Flux Structural Biology II Structural Biology I Infrared Materials Science R&D HXPES • MCT BL01B1 BL02B1 BL02B2 BL04B1 BL04B2 BL08W BL09XU BL10XU BL13XU BL14B2 BL19B2 BL20XU BL20B2 BL25SU BL27SU BL28B2 BL35XU BL37XU BL38B1 BL39XU BL40XU BL40B2 BL41XU BL43IR BL46XU BL47XU XAFS in wide energy region (3.8 to 113 keV). XAFS of dilute systems and thin films. Structure physics using single crystal analysis. Precise structure analysis of photo-excited state. Accurate structure analysis of crystalline materials using powder diffraction data by Rietveld refinements and MEM (maximum entropy method). Mineral physics at high temperature and high pressure. Energy-dispersive X-ray diffraction and X-ray radiography using the large-volume press. Structural analysis of glass, liquid, and amorphous materials. X-ray diffraction under ultra high-pressure. Precise single crystal structure analysis Magnetic Compton scattering. High-resolution Compton scattering. High-energy Bragg scattering. High-energy fluorescent X-ray analysis. Time domain Mössbauer spectroscopy. Lattice dynamics study using nuclear resonant scattering. Structure physics and earth science under ultra high pressure using DAC. Medium-length hard X-ray bending magnet beamline designed for engineering science researches. X-ray absorption spectroscopy. Atomic-scale structure analysis of an ultra-thin film, nanostructure and surface, using in-air measurements (room temperature to 500 ºC) and in-vacuum measurements (20 to 1300 K). High resolution photoemission spectroscopy. Photoelectron diffraction and holography. Magnetic circular dichroism (MCD). Photoelectron emission microscope (PEEM). Industrial application using XAFS in wide energy region, residual stress measurement, structural analysis of thin film, surface and interface, powder diffraction, and X-ray imaging. Medical application: Microangiography, refraction-enhanced imaging. / Microimaging: Scanning microscopy, imaging microscopy, microtomography, X-ray holography and X-ray optics. / Ultra-small angle scattering. Medical application: Microradiography, micro-tomography and refraction-enhanced imaging. / Microimaging: R&D of optical elements for novel imaging techniques. Industrial research of functional material. Atomic and molecular spectroscopy by high resolution electron spectroscopy. Surface analysis and solid state physics. White X-ray diffraction. Time-resolved energy-dispersive XAFS (DXAFS) . Material dynamics on ~ meV energy scales using inelastic X-ray scattering (IXS) and nuclear resonant scattering (NRS). X-ray microbeam spectrochemical analysis. Ultra trace element analysis. High energy X-ray fluorescence analysis. XAFS. R&D of optics and detector. Macromolecular crystallography. X-ray magnetic circular dichroism (XMCD) spectroscopy. Element-specific magnetometry. X-ray emissio n spectroscopy and its magnetic circular dichroism. Resonant or non-resonant magnetic scattering. Time-resolved diffraction and scattering experiments. X-ray speckle. X-ray fluorescence trace analysis. Macromolecular crystallography. Small angle X-ray (solution) scattering. Biological macromolecular crystallography. Infrared microspectroscopy. Magneto-optical spectroscopy. Infrared surface science. Absorption and reflection spectroscopy. Time-resolved experiments with pulsed laser and SR (pump and probe). Insertion devices R&D. Resonant and non-resonant magnetic scattering structural analysis. R&D of microtomography and microbeam technique. High energy photoemission spectroscopy. (Public Use) (Oct. 1997) (Oct. 1997) (Sept. 1999) (Oct. 1997) (Sept. 1999) (Oct. 1997) (Oct. 1997) (Oct. 1997) (Sept. 2001) (Sept. 2007) (Nov. 2001) (Apr. 1998) (May 1998) (Nov. 2002) (Oct. 2000) (Oct. 1997) (Apr. 2000) (Oct. 1997) (Apr. 2000) (Nov. 2000) (Oct. 1997) (Sept. 1999) (Sept. 2001) (Sept. 1999) (Sept. 2001) (Sept. 1999) (September, 2007) Table III. List of beamlines 219 220 NSRRC ID (National Synchrotron Rad. Res. Center) NSRRC BM (National Synchrotron Rad. Res. Center) WE B R A M (National I nstit u te f or M aterials Science) I ndustrial C onsortium ID ( I nd u strial Consorti u m ) I ndustrial C onsortium BM ( I nd u strial Consorti u m ) Ph arma ce uti c al I ndustr y ( P har m ace u tical Consorti u m f or P rotein Str u ct u re A nalysis) L as e r - E l ec tron Ph oton (RCN P , O sa k a U ni v ersity) M a c romol ec ular A ss e m b li e s ( I P R , O sa k a U ni v ersity) J AEA Q uantum D y nami c s J AEA M at e rials S c i e n ce J AEA Q uantum S tru c tural S c i . J AEA A c tinid e S c i e n ce RI K E N C o he r e nt S o f t X - ra y S p ec tros c o p y RI K E N S tru c tural G e nomi c s I & II RI K E N C o he r e nt X - ra y Op ti c s RI K E N S tru c tural B iolo g y II RI K E N S tru c tural B iolo g y I B L 17 S U B L 19 L XU B L 26 B 1/ B 2 B L 29XU B L 44 B 2 B L 45XU B L 38 B 2 A cce l e rator B e am D ia g nosis A cce l e rator B e am D ia g nosis B L # B e amlin e N am e C ontra c t B e amlin e s A r e as o f R e s e ar ch X- ray a b sor p tion s p ectrosco p y. P o w der X- ray di ff raction. H i g h resol u tion X- ray scatterin g . P rotein crystallo g ra p hy. H i g h resol u tion X- ray p hotoe m ission m icrosco p y. H i g h ener g y e x citation X- ray p hotoelectron s p ectrosco p y. H i g h resol u tion X- ray e m ission s p ectrosco p y. H i g hly p recise X- ray p o w der di ff raction and u ltra - s m all an g le scatterin g . Characteri z ation o f thin f il m s f or UL S I and m a g netic de v ices , catalysts , fu nctional m aterials , and str u ct u ral m aterials b y X- ray di ff raction , f l u orescence X- ray analysis , X- ray m a g netic circ u lar dichrois m , and i m a g in g w ith X- ray m icro b ea m . Characteri z ation o f ind u strial m aterials , s u ch as m etal and o x ide f il m s , se m icond u ctor crystals b y X A F S , to p o g ra p hy and other m ethods. P rotein str u ct u re analysis f or str u ct u re -b ased dr u g desi g n : D esi g n and o p ti m i z ation o f ne w leadin g co m p o u nds b ased on p har m acodyna m ic action m echanis m el u cidated at the m olec u lar le v el w hich o b tained f ro m a detailed interaction analysis o f rece p tor - dr u g co m p le x es. M eson p hoto p rod u ction f ro m n u cleon and n u cle u s. P hotoe x citation o f hy p erons , n u cleon resonances , and other e x otic states. P hoton u clear reactions. B ea m dia g noses. T est and cali b ration o f detectors w ith G e V p hoton b ea m . Crystal str u ct u re analysis o f b iolo g ical m acro m olec u lar asse m b lies (e. g . m e m b rane co m p le x es , p rotein co m p le x es , p rotein - n u cleic acid co m p le x es , and v ir u ses). H i g h resol u tion non - resonant or resonant inelastic X- ray scatterin g . H i g h resol u tion near - ed g e X- ray Ra m an scatterin g . P hase transitions u nder hi g h -p ress u re , lo w and hi g h te m p erat u res. H i g h - resol u tion X- ray a b sor p tion and e m ission s p ectrosco p y. X- ray p hysics and o p tics. N u clear resonant scatterin g . S u r f ace and inter f ace str u ct u re w ith M BE . I nelastic scatterin g . X A F S. M aterials science at hi g h p ress u re. Str u ct u re p hysics. M aterials science at hi g h p ress u re. Resonant X- ray scatterin g (acti v ity at R I la b oratory). S u r f ace che m istry w ith s u p ersonic m olec u lar b ea m . B io p hysical s p ectrosco p y. P hotoelectron s p ectrosco p y (acti v ity at R I la b oratory). M a g netic circ u lar dichrois m (acti v ity at R I la b oratory). S p ectrosco p y o f m u lti p ly char g ed ions. A n g le - resol v ed p hotoe m ission s p ectrosco p y ( A R P E S). So f t X- ray e m ission s p ectrosco p y. RI K E N B e amlin e s M acro m olec u lar crystallo g ra p hy. A ny research f ield re q u irin g the hi g hly b rilliant X- ray b ea m . Str u ct u ral g eno m ics research b ased on sin g le crystal X- ray di ff raction. X- ray o p tics , es p ecially coherent X- ray o p tics. M acro m olec u lar crystallo g ra p hy. T i m e - resol v ed str u ct u res o f non - crystalline b iolo g ical m aterials u sin g s m all - an g le scatterin g and di ff raction techni q u e. RI K E N SR Phy si c s A ccelerator b ea m dia g nostics. R &D o f accelerator co m p onents. P rod u ction o f M e V γ - ray p hotons. ( F irst B ea m ) H y o g o ID ( H yo g o P re f ect u re) Str u ct u re analysis o f s m all b io - crystals f or ind u stry. S u r f ace / inter f ace analysis f or ind u stry b y f l u orescent X- ray analysis , strain m eas u re m ents and g ra z in g incidence X- ray di ff raction. M icro b ea m f or m ation st u dies f or m aterials and li f e sciences. B L 05 SS A cce l e rator B e am D ia g nosis A ccelerator b ea m dia g nostics. R &D o f accelerator co m p onents. H y o g o BM ( H yo g o P re f ect u re) B L 12XU B L 12 B 2 B L 15XU B L 16XU B L 16 B 2 B L 32 B 2 B L 33 L E P B L 44XU B L 11XU B L 14 B 1 B L 22XU B L 23 S U B L 24XU B L 08 B 2 X A F S in a w ide ener g y re g ion. S m all an g le X- ray scatterin g f or str u ct u ral analyses o f p oly m er and nano - co m p osite m aterials. X- ray to p o g ra p hy. I m a g in g . P o w der di ff raction w ith a hi g h an g u lar resol u tion. ( O ct. 1998 ) ( O ct. 2000 ) ( D ec. 2001 ) ( J an. 2000 ) ( M ay 1998 ) ( A p r. 2002 ) ( J u n. 1999 ) ( M ay 1999 ) ( O ct. 1998 ) ( D ec. 1998 ) ( D ec. 1997 ) ( F e b . 1998 ) ( F e b . 1998 ) ( J u l. 1997 ) ( A p r. 2002 ) ( O ct. 2000 ) (Se p t. 2003 ) ( M ay 2002 ) ( O ct. 1998 ) ( M ar. 2004 ) (Se p t. 1999 ) ( J u n. 2005 ) (Se p te m b er , 2007 )
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